RH37C TABLE 1A: ELECTRICAL CHARACTERISTICSNote 1: Input offset voltage measurements are performed by automatic Note 6: See test circuit for current noise measurement on OP-27/OP-37 test equipment approximately 0.5 seconds after application of power. data sheet. Note 2: Long-term input offset voltage stability refers to the average trend Note 7: The average input offset drift performance is within the specifica- line of offset voltage vs time over the first 30 days of operation. Excluding tions unnulled or when nulled with a pot having a range 8kΩ to 20kΩ. the initial hour of operation, changes in VOS during the first 30 days are Note 8: The RH37C’s inputs are protected by back-to-back diodes. Current typically 2.5µV. Refer to the typical performance curves. limiting resistors are not used in order to achieve low noise. If differential Note 3: Sample tested to an LTPD of 15 on every lot. Contact factory for input voltage exceeds ±0.7V, the input current should be limited to 25mA. 100% testing of 10Hz voltage density noise. Note 9: VS = ±15V, VCM = 0V unless otherwise noted. Note 4: Parameter is guaranteed by design, characterization, or correlation Note 10: TA = 25°C, VS = ±15V, VCM = 0V, unless otherwise noted. to other tested parameters. Note 5: See test circuit and frequency response curve for 0.1Hz to 10Hz tester on OP-27/OP-37 data sheet. TOTAL DOSE BIAS CIRCUIT 10k 15V – 10k + 8V –15V W UTYPICAL PERFOR A CE CHARACTERISTICSPositive Slew RateNegative Slew Rate 25 25 V V S = ±15V S = ±15V R R L = 2k L = 2k 20 A A VCL ≥ 5 VCL ≥ 5 µs) µs) 20 15 15 10 10 POSITIVE SLEW RATE (V/ 5 NEGATIVE SLEW RATE (V/ 0 0 1 10 100 1000 1 10 100 1000 TOTAL DOSE KRAD (Si) TOTAL DOSE KRAD (Si) RH37C G01 RH37C G02 Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no represen- tation that the interconnection of its circuits as described herein will not infringe on existing patent rights. 3
