INA 200 INA200 INA201 INA202
SBOS374C NOVEMBER 2006 REVISED OCTOBER 2010 www.ti.com High-Side Measurement Current-Shunt Monitor with Open-Drain Comparator and Reference
Check for Samples: INA200, INA201, INA202
1 FEATURES
COMPLETE CURRENT SENSE SOLUTION 0.6V INTERNAL VOLTAGE REFERENCE INTERNAL OPEN-DRAIN COMPARATOR LATCHING CAPABILITY ON COMPARATOR COMMON-MODE RANGE: 16V to +80V HIGH ACCURACY: 3.5% MAX ERROR OVER TEMPERATURE BANDWIDTH: 500kHz (INA200) QUIESCENT CURRENT: 1800mA (max) PACKAGES: SO-8, MSOP-8 DESCRIPTION
The INA200, INA201, and INA202 are high-side current-shunt monitors with voltage output. The INA200INA202 can sense drops across shunts at common-mode voltages from 16V to 80V. The INA200INA202 are available with three output voltage scales: 20V/V, 50V/V, and 100V/V, with up to 500kHz bandwidth. The INA200, INA201, and INA202 also incorporate an open-drain comparator and internal reference providing a 0.6V threshold. External dividers are used to set the current trip point. The comparator includes a latching capability, which can be made transparent by grounding (or leaving open) the RESET pin. The INA200, INA201, and INA202 operate from a single +2.7V to +18V supply, drawing a maximum of 1800mA of supply current. Package options include the very small MSOP-8 and the SO-8. All versions are specified over the extended operating temperature range of 40°C to +125°C. APPLICATIONS NOTEBOOK COMPUTERS CELL PHONES TELECOM EQUIPMENT AUTOMOTIVE POWER MANAGEMENT BATTERY CHARGERS WELDING EQUIPMENT 1 V+ INA200 (G = 20) INA201 (G = 50) INA202 (G = 100) VIN+ 8 7 2 OUT 0.6V Reference 3 CMPIN G VIN-Comparator CMPOUT 6 4 GND RESET 5 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 20062010, Texas Instruments Incorporated INA200 INA201 INA202
SBOS374C NOVEMBER 2006 REVISED OCTOBER 2010 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuit …
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