Datasheet Texas Instruments SN54HC08VTDF1 — Даташит

SN54HC08-DIE
www.ti.com SCLS734 – JUNE 2013 RAD-TOLERANT SPACE GRADE DIE, QUADRUPLE 2-INPUT POSITIVE-AND GATES
Check for Samples: SN54HC08-DIE FEATURES 1 Wide Operating Voltage Range
Outputs Can Drive Up To 10 LSTTL Loads
Low Power Consumption
Typical tpd = 8 ns
Low Input Current DESCRIPTION
The SN54HC08-DIE device contains four independent 2-input AND gates. Each gate performs the Boolean
function of Y = A B or Y = A + B in positive logic.
ORDERING INFORMATION (1) (1)
(2) PRODUCT PACKAGE
DESIGNATOR PACKAGE SN54HC08V TD Bare die in waffle pack (2) ORDERABLE PART NUMBER PACKAGE QUANTITY SN54HC08VTDF1 100 SN54HC08VTDF2 10 For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
Processing is per the Texas Instruments space production baseline and is in compliance with the Texas Instruments Quality Control
System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room temperature
only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not warranted. Visual
Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum. 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters. Copyright В© 2013, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are …