Datasheet Texas Instruments SN54HC00-DIE — Даташит

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SCLS747 – FEBRUARY 2014 SN54HC00-DIE Quadruple 2-Input Positive-NAND Gate
1 1 Features Wide Operating Voltage Range
Low Power Consumption
Low Input Current 2 Description
The SN54HC00-DIE device contains four independent 2-input NAND gates. Each gate performs the Boolean
function of Y = A B or Y = A + B in positive logic.
Ordering Information (1) (1)
(2) PRODUCT PACKAGE
DESIGNATOR PACKAGE SN54HC00 TD Bare die in waffle pack (2) ORDERABLE PART NUMBER PACKAGE QUANTITY SN54HC00TDF1 400 SN54HC00TDF2 10 For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum. 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA. SN54HC00-DIE
SCLS747 – FEBRUARY 2014 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. …