link to page 4 link to page 4 link to page 4 CAT5113Table 1. OPERATION MODESINCCSU/DOperation High to Low Low High Wiper toward H High to Low Low Low Wiper toward L High Low to High X Store Wiper Position Low Low to High X No Store, Return to Standby X High X Standby Table 2. ABSOLUTE MAXIMUM RATINGSParametersRatingsUnits Supply Voltage V VCC to GND −0.5 to +7 Inputs V CS to GND −0.5 to VCC +0.5 INC to GND −0.5 to VCC +0.5 V U/D to GND −0.5 to VCC +0.5 V H to GND −0.5 to VCC +0.5 V L to GND −0.5 to VCC +0.5 V W to GND −0.5 to VCC +0.5 V Operating Ambient Temperature C Commercial (‘C’ or Blank suffix) 0 to 70 Industrial (‘I’ suffix) −40 to +85 C Junction Temperature +150 C Storage Temperature −65 to 150 C Lead Soldering (10 s max) +300 C Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. Table 3. RELIABILITY CHARACTERISTICSSymbolParameterTest MethodMinTypMaxUnits VZAP (Note 1) ESD Susceptibility MIL−STD−883, Test Method 3015 2000 V ILTH (Notes 1, 2) Latch-Up JEDEC Standard 17 100 mA TDR Data Retention MIL−STD−883, Test Method 1008 100 Years NEND Endurance MIL−STD−883, Test Method 1003 1,000,000 Stores 1. This parameter is tested initially and after a design or process change that affects the parameter. 2. Latch-up protection is provided for stresses up to 100 mA on address and data pins from −1 V to VCC + 1 V http://onsemi.com4
