Datasheet LTC2271 (Analog Devices) - 3

LTC2271
CONVERTER CHARACTERISTICS The
l
denotes the specifi cations which apply over the full operating temperature range, otherwise specifi cations are at TA = 25°C. (Note 5) PARAMETER CONDITIONS MIN TYP MAX UNITS
Resolution (No Missing Codes) l 16 Bits Integral Linearity Error Differential Analog Input (Note 6) l –2.6 ±1 2.6 LSB Differential Linearity Error Differential Analog Input l –0.8 ±0.2 0.8 LSB Offset Error (Note 7) l –7 ±1.3 7 mV Gain Error Internal Reference ±1.2 %FS External Reference l –1.6 –0.3 1 %FS Offset Drift ±10 μV/°C Full-Scale Drift Internal Reference ±30 ppm/°C External Reference ±10 ppm/°C Gain Matching l –0.2 ±0.06 0.2 %FS Offset Matching l –10 ±1.5 10 mV Transition Noise 1.44 LSBRMS
ANALOG INPUT The
l
denotes the specifi cations which apply over the full operating temperature range, otherwise specifi cations are at TA = 25°C. (Note 5) SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
VIN Analog Input Range (AIN+ – AIN–) 1.7V < VDD < 1.9V l 1 to 2.1 VP-P VIN(CM) Analog Input Common Mode (AIN+ + AIN–)/2 Differential Analog Input (Note 8) l 0.65 VCM VCM + 200mV V VSENSE External Voltage Reference Applied to SENSE External Reference Mode l 0.625 1.250 1.300 V IINCM Analog Input Common Mode Current Per Pin, 20Msps 32 μA IIN1 Analog Input Leakage Current (No Encode) 0 < AIN+, AIN– < VDD l –1 1 μA IIN2 PAR/SER Input Leakage Current 0 < PAR/SER < VDD l –1 1 μA IIN3 SENSE Input Leakage Current 0.625V < SENSE < 1.3V l –2 2 μA tAP Sample-and-Hold Acquisition Delay Time 0 ns tJITTER Sample-and-Hold Acquisition Delay Jitter Single-Ended Encode 85 fsRMS Differential Encode 100 fsRMS CMRR Analog Input Common Mode Rejection Ratio 80 dB BW–3B Full-Power Bandwidth Figure 5 Test Circuit 200 MHz 2271f 3