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Datasheet AD558 Military (Analog Devices) - 9

ПроизводительAnalog Devices
Страниц / Страница11 / 9 — STANDARD. 5962-87789. MICROCIRCUIT DRAWING
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Язык документаанглийский

STANDARD. 5962-87789. MICROCIRCUIT DRAWING

STANDARD 5962-87789 MICROCIRCUIT DRAWING

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Микросхема Преобразователь DA, DAC 1CH R-2R 8Bit 20Pin PLCC T/R
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Analog Devices
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Analog Devices
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4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA = +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. c. Optional subgroup 12 is used for grading and part selection at +25C, it is not included in PDA. TABLE II. Electrical test requirements. Subgroups (in accordance with MIL-STD-883 test requirements MIL-STD-883, method 5005, table I) Interim electrical parameters 1 (method 5004) Final electrical test parameters 1*, 2, 3, 9, 12 (method 5004) Group A test requirements 1, 2, 3, 7**, 8**, 9, 10, 11, 12 (method 5005) Groups C and D end-point electrical parameters 1 (method 5005) * PDA applies to subgroup 1. ** Subgroups 7 and 8 are guaranteed, if not tested, to the limits specified in table I. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD- 883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroups 7 and 8 shall include verification of the truth table. d. Optional subgroup 12 is used for grading and part selection at +25C. SIZE
STANDARD A 5962-87789 MICROCIRCUIT DRAWING
DLA LAND AND MARITIME REVISION LEVEL SHEET COLUMBUS, OHIO 43218-3990 C
9
DSCC FORM 2234 APR 97
ТМ Электроникс. Электронные компоненты и приборы. Скидки, кэшбэк и бесплатная доставка