Datasheet LTC2984 (Analog Devices) - 8

LTC2984
TYPICAL PERFORMANCE CHARACTERISTICS RTD PT-200 Error and RMS Noise RTD PT-100 Error and RMS Noise RTD NI-120 RTD Error and vs Temperature vs Temperature RMS Noise vs Temperature
1.0 1.0 1.0 0.8 0.8 0.8 0.6 0.6 0.6 0.4 0.4 0.4 0.2 0.2 0.2 0 0 0 –0.2 –0.2 –0.2 –0.4 –0.4 –0.4 ERROR/RMS NOISE (°C) ERROR/RMS NOISE (°C) ERROR/RMS NOISE (°C) –0.6 –0.6 –0.6 –0.8 RMS NOISE –0.8 RMS NOISE –0.8 RMS NOISE ERROR ERROR ERROR –1.0 –1.0 –1.0 –400 0 400 800 –400 –200 0 200 400 600 800 1000 –100 0 100 200 300 RTD TEMPERATURE (°C) RTD TEMPERATURE (°C) RTD TEMPERATURE (°C) 2984 G10 2984 G11 2984 G12
2.252k Thermistor Error vs Temperature 3k Thermistor Error vs Temperature 5k Thermistor Error vs Temperature
1.0 1.0 1.0 0.8 0.8 0.8 0.6 0.6 0.6 0.4 0.4 0.4 0.2 0.2 0.2 0 0 0 ERROR (°C) –0.2 ERROR (°C) –0.2 ERROR (°C) –0.2 –0.4 –0.4 –0.4 –0.6 –0.6 –0.6 –0.8 –0.8 –0.8 –1.0 –1.0 –1.0 –40 –20 0 20 40 60 80 100 120 140 –40 –20 0 20 40 60 80 100 120 140 –40 –20 0 20 40 60 80 100 120 140 THERMISTOR TEMPERATURE (°C) THERMISTOR TEMPERATURE (°C) THERMISTOR TEMPERATURE (°C) 2984 G13 2984 G14 2984 G15
30k Thermistor Error vs YSI-400 Thermistor Error vs 10k Thermistor Error vs Temperature Temperature Temperature
1.0 1.0 1.0 0.8 0.8 0.8 0.6 0.6 0.6 0.4 0.4 0.4 0.2 0.2 0.2 0 0 0 ERROR (°C) –0.2 ERROR (°C) –0.2 ERROR (°C) –0.2 –0.4 –0.4 –0.4 –0.6 –0.6 –0.6 –0.8 –0.8 –0.8 –1.0 –1.0 –1.0 –40 –20 0 20 40 60 80 100 120 140 –40 –20 0 20 40 60 80 100 120 140 –40 –20 0 20 40 60 80 100 120 140 THERMISTOR TEMPERATURE (°C) THERMISTOR TEMPERATURE (°C) THERMISTOR TEMPERATURE (°C) 2984 G16 2984 G17 2984 G18 2984fb 8 For more information www.linear.com/LTC2984 Document Outline Features Applications Typical Application Description Absolute Maximum Ratings Order Information Pin Configuration Complete System Electrical Characteristics ADC Electrical Characteristics Reference Electrical Characteristics Digital Inputs and Digital Outputs EEPROM Characteristics Typical Performance Characteristics Pin Functions Block Diagram Test Circuits Timing Diagram Overview Applications Information EEPROM Overview Eeprom Read/Write Validation EEPROM Write Operation EEPROM Read Operation Thermocouple Measurements Diode Measurements RTD Measurements Thermistor Measurements Supplemental Information Direct ADC Measurements Fault Protection and Anti-Aliasing 2- and 3-Cycle Conversion Modes Running Conversions Consecutively on Multiple Channels Entering/Exiting Sleep Mode MUX Configuration Delay Global Configuration Register Reference Considerations Custom Thermocouples Custom RTDs Custom Thermistors Package Description Revision History Typical Application Related Parts