Datasheet LTC2986, LTC2986-1 (Analog Devices) - 9

LTC2986/LTC2986-1
TYPICAL PERFORMANCE CHARACTERISTICS Diode Error and Repeatability vs Temperature Offset vs Temperature Noise vs Temperature
1.0 2.0 1.2 0.8 1.5 1.0 0.6 1.0 0.4 ) 0.8 0.2 V) 0.5 V RMS 0 0 0.6 ERROR (°C) –0.2 OFFSET (µ –0.5 NOISE (µ 0.4 –0.4 –1.0 –0.6 VDD = 5.25V 0.2 VDD = 5.25V –1.5 V –0.8 DD = 4.1V VDD = 4.1V VDD = 2.85V VDD = 2.85V –1.0 –2.0 0 –40 20 80 140 –50 –25 0 25 50 75 100 125 –50 –25 0 25 50 75 100 125 DIODE TEMPERATURE (°C) LTC2986 TEMPERATURE (°C) LTC2986 TEMPERATURE (°C) 29861 G19 29861 G20 29861 G21
One Shot Conversion Current vs ISLEEP vs Temperature Temperature VREFOUT V vs Temperature REFOUT vs T
60 16.0 2.5005 VDD = 5.25V VDD = 5.25V V 15.8 VDD = 4.1V 50 DD = 4.1V VDD = 2.85V 15.6 VDD = 2.85V 2.50025 15.4 40 15.2 (V) (µA) 30 (mA) 15.0 2.5 I SLEEP I IDLE 14.8 V REFOUT 20 14.6 2.49975 14.4 10 14.2 0 0 2.4995 –50 –25 0 25 50 75 100 125 –50 –25 0 25 50 75 100 125 –50 –30 –10 10 30 50 70 90 110 130 LTC2986 TEMPERATURE (°C) LTC2986 TEMPERATURE (°C) TEMPERATURE (°C) 29861 G22 29861 G23 29861 G24
Channel Input Leakage Current vs Adjacent Channel Offset Error vs Adjacent Channel Offset Error vs Temperature Temperature Input Fault Voltage (VDD = 5V) Input Fault Voltage
1.4 2.5 2.5 125°C 90°C 1.2 25°C 2.0 2.0 –45°C V) V) 1.0 1.5 1.5 0.8 1.0 1.0 0.6 0.5 0.5 INPUT LEAKAGE (nA) 0.4 CH2 OFFSET ERROR (µ CH2 OFFSET ERROR (µ 0 0 0.2 0 –0.5 –0.5 –1 0 1 2 3 4 5 6 4.95 5 5.05 5.1 5.15 5.2 5.25 5.3 5.35 0 –0.05 –0.1 –0.15 –0.2 –0.25 –0.3 –0.35 INPUT VOLTAGE (V) CH1 FAULT VOLTAGE (V) CH1 FAULT VOLTAGE (V) 29861 G25 29861 G26 29861 G27 29861fa For more information www.linear.com/LTC2986 9 Document Outline Features Applications Typical Application Description Absolute Maximum Ratings Order Information Pin Configuration Complete System Electrical Characteristics ADC Electrical Characteristics Reference Electrical Characteristics Digital Inputs and Digital Outputs LTC2986-1 EEPROM Characteristics Typical Performance Characteristics Pin Functions Block Diagram Test Circuits Timing Diagram Overview Applications Information EEPROM Overview (LTC2986-1) EEPROM Read/Write Validation EEPROM Write Operation EEPROM Read Operation (LTC2986-1) Thermocouple Measurements Diode Measurements RTD Measurements Thermistor Measurements Global Configuration Register Input Overvoltage Protection – Overview Active Analog Temperature Sensors Direct ADC Measurements 2- and 3-Cycle Conversion Modes Running Conversions Consecutively on Multiple Channels Entering/Exiting Sleep Mode MUX Configuration Delay Reference Considerations Custom Thermocouples Custom RTDs Custom Thermistors Package Description Revision History Typical Application Related Parts