Datasheet LT5570 (Analog Devices) - 9

LT5570
TEST CIRCUITS
5V C1 C2 C3 22nF 1nF 1MF 1 10 RF T1 VCC FLTR INPUT L1 1 1:4 3 2 9 IN+ EN ENABLE J1 C7 2 3 8 R1 DEC LT5570 DNC NC 100k 5 4 4 7 IN– DNC NC 5 6 C4 GND OUT OUT 1nF EXPOSED PAD C6 5570 F01 (OPT)
REF DES VALUE SIZE PART NUMBER
C2, C4 1nF 0402 AVX 0402ZC102KAT C1 22nF 0402 AVX 0402YC223KAT C3 1μF 0603 Taiyo Yuden LMK107BJ105MA R1 100k 0402 CRCW0402100KFKED
FREQUENCY T1 L1 L1 P/N C7
880MHz MURATA LDB21869M20C-001 8.2nH TOKO LL1005-FH8N25 2.7pF MURATA GRM1555C1H2R7DZ01 2140MHz MURATA LDB212G1020-001 3.3nH TOKO LL1005-FH3N35 0.5pF MURATA GRM1555C1HR50CZ01 2700MHz MURATA LDB212G4020-001 1.2nH TOKO LL1005-FH1N25 1pF MURATA GRM1555C1H1R0DZ01
Figure 1. Test Schematic for 880MHz, 2140MHz and 2700MHz Applications Figure 2. Top Side of Evaluation Board for 880MHz, 2140MHz and 2700MHz Applications
5570f 9