Datasheet LTC5587 (Analog Devices) - 8

LTC5587
TYPICAL PERFORMANCE CHARACTERISTICS VCC = VDD = OVDD = 3.3V, VREF = 1.8V, EN = 3.3V, fSMPL = fSMPL(MAX) and fSCK = fSCK(MAX) unless otherwise noted. VOUT = ADC Output (LSB) • 1.8/4096. Test circuit is shown in Figure 1. Output Voltage and Linearity Output Voltage Temperature Linearity Error vs RF Input Power Error at 5800MHz Variation from 25°C at 5800MHz 5.8GHz Modulated Wavefroms
2.0 2.5 3 3 25°C TA = 25°C 1.8 85°C 2.0 – 40°C 2 2 1.6 1.5 LINEARITY ERROR (dB) 1.4 1.0 1 1 85°C 1.2 0.5 (V) 1.0 0 0 –40°C 0 OUTV 0.8 –0.5 VARIATION (dB) –1 –1 0.6 –1.0 LINEARITY ERROR (dB) 0.4 –1.5 –2 –2 0.2 –2.0 CW WiMax OFDM BURST 0 –2.5 –3 –3 –40 –35 –30 –25 –20 –15 –10 –5 0 5 10 –40 –35 –30 –25 –20 –15 –10 –5 0 5 10 –35 –30 –25 –20 –15 –10 –5 0 5 10 RF INPUT POWER (dBm) RF INPUT POWER (dBm) RF INPUT POWER (dBm) 5587 G19 5587 G20 5587 G21
Slope Distribution vs Slope vs Frequency Temperature Supply Current vs Supply Voltage
34 50 5 TA = 25°C TA = –40°C fSMPL = 500kHz TA = 25°C TA = 85°C 40 4 32 30 3 30 20 2 SLOPE (mV/dB) AGE DISTRIBUTION (%) 28 SUPPLY CURRENT (mA) 10 1 PERCENT 85°C 25°C –40°C 26 0 0 0 1 2 3 4 5 6 28 29 30 31 32 33 34 2.7 2.8 2.9 3 3.1 3.2 3.3 3.4 3.5 3.6 FREQUENCY (GHz) SLOPE (mV/dB) SUPPLY VOLTAGE (V) 5587 G23 5587 G24 5587 G25
Logarithmic Intercept vs Logarithmic Intercept Distribution Total Supply Current vs RF Input Frequency vs Temperature Power and Sample Rate
–30 50 16 T T A = 25°C A = –40°C TA = 25°C TA = 25°C 14 TA = 85°C 40 500kHz –35 12 100kHz 200kHz 30 10 –40 8 20 AGE DISTRIBUTION (%) 6 –45 4 10 TOTAL SUPPLY CURRENT (mA) LOGARITHMIC INTERCEPT (dBm) PERCENT 2 –50 0 0 0 1 2 3 4 5 6 –48 –47 –46 –45 –44 –43 –42 –41 –30 –25 –20 –15 –10 –5 0 5 10 15 FREQUENCY (GHz) LOGARITHMIC INTERCEPT (dBm) RF INPUT POWER (dBm) 5587 G26 5587 G27 5587 G28 5587f 8 Document Outline FEATURES DESCRIPTION APPLICATIONS BLOCK DIAGRAM ABSOLUTE MAXIMUM RATINGS PIN CONFIGURATION ORDER INFORMATION ELECTRICAL CHARACTERISTICS TYPICAL PERFORMANCE CHARACTERISTICS PIN FUNCTIONS BLOCK DIAGRAM TIMING DIAGRAMS TEST CIRCUIT APPLICATIONS INFORMATION PACKAGE DESCRIPTION TYPICAL APPLICATION RELATED PARTS