Datasheet ADXRS645 (Analog Devices) - 8

Data Sheet ADXRS645 40 2000 1800 35 ) % ( 1600 30 TION 1400 LA 25 U °/sec) 1200 ( OP UT 20 P 1000 OF P UT 800 GE 15 2 O T TA S N 600 E 10 C R 400 E P 5 200 0 0
13
–50 0 50 100 150 200
1 10
1200 1250 1300 1350 1400 1450 1500 1550 1600 1650 1700
1
TEMPERATURE (°C)
1958- 1
ST2 OUTPUT CHANGE (°/sec)
1958- 1 Figure 11. ST2 Output Change at 25°C (VRATIO = 5 V) Figure 14. ST2 Output Over Temperature
45 10000 40 ) % ( 35 r) 1000 u TION 30 LA °/Ho AVERAGE U ( OP 25 +1σ ANCE 100 OF P 20 ARI GE –1σ 15 TA AN V N L E 10 C AL 10 R E P 5 0 1 0 5 0 5 0 5 0 5 0 5 0
14
0.01 0.1 1 10 100 1000 10000
1
0. 1. 1. 2. 2. 3.
1
–2. –1. –1. –0.
11
AVERAGING TIME (Seconds)
1958- 1
SELF-TEST MISMATCH (%)
1958- 1 Figure 12. Self-Test Mismatch at 25°C (VRATIO = 5 V) Figure 15. Allan Variance at 25°C vs. Averaging Time
40 4.0 35 ) % ( 3.5 30 TION LA 25 (V) U T 3.0 OP PU T 20 U OF P O P 2.5 GE 15 EM T TA V N E 10 C R 2.0 E P 5 0 1.5
15
38 40 42 44 46 48 50 52 54 56 58 –50 0 50 100 150 200
1
2. 2. 2. 2. 2. 2. 2. 2. 2. 2. 2.
12 1
TEMPERATURE (°C)
1958- 1
VTEMP OUTPUT (V)
1958- 1 Figure 13. VTEMP Output at 25°C Figure 16. VTEMP Output Over Temperature Rev. A | Page 7 of 10 Document Outline Features Applications General Description Functional Block Diagram Table of Contents Revision History Specifications Absolute Maximum Ratings Rate Sensitive Axis ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics Theory of Operation Setting Bandwidth Temperature Output and Calibration Supply Ratiometricity Range Extension Self-Test Function Continuous Self-Test Outline Dimensions Ordering Guide