Datasheet ADXRS649 (Analog Devices) - 7

ADXRS649 Data Sheet TYPICAL PERFORMANCE CHARACTERISTICS
N > 1000 for all histograms, unless otherwise noted.
0 0 60 –3 –30 50 ) B –6 –60 ) 40 % SE (d ( rees) N –9 –90 Deg TION ( 30 A ESPO E L PU E R T HAS A –12 –120 P PO 20 R –15 –150 10 –18 –180 0 0.1 1 10
004
2.401 2.434 2.467 2.500 2.533 2.566 2.599
007
2.418 2.451 2.484 2.517 2.550 2.583 FREQUENCY (kHz)
09573-
NULL BIAS (V)
09573- Figure 4. Typical Rate and Phase Response vs. Frequency Figure 7. Null Bias at 25°C (COUT = 470 pF with a Series RC Low-Pass Filter of 3.3 kΩ and 22 nF)
4.0 60 3.5 50 3.0 ) 40 2.5 % ( (V) T U 2.0 TION 30 A E O L T A PU R 1.5 PO 20 1.0 10 0.5 0 0 0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
005
0.081 0.085 0.089 0.093 0.097 0.101 0.105 0.109 0.113 0.117
008
TIME (ms) SENSITIVITY (mV/°/sec)
09573- 09573- Figure 5. Typical Start-Up Behavior at RATEOUT Figure 8. Sensitivity at 25°C
10000 100 80 ) (° R ) U % O ( 60 H 1000 TION A L EES PER PU 40 R PO EG D 20 100 0 0.01 0.1 1 10 100 1000
006
–100 –500 –900 –1300 –1700 –2100 –300 –700 –1100 –1500 –1900 –2300
009
TIME (Seconds)
09573-
DEGREES PER SECOND (°)
09573- Figure 6. Typical Root Allan Deviation at 25°C vs. Averaging Time Figure 9. ST1 Output Change at 25°C (VRATIO = 5 V) Rev. B | Page 6 of 12 Document Outline Features Applications General Description Functional Block Diagram Revision History Specifications Absolute Maximum Ratings Rate Sensitive Axis ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics Theory of Operation Setting the Bandwidth Temperature Output and Calibration Modifying the Measurement Range Null Bias Adjustment Self-Test Function Continuous Self-Test Outline Dimensions Ordering Guide