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Datasheet AD813 (Analog Devices) - 9

ПроизводительAnalog Devices
ОписаниеSingle Supply, Low Power Triple Video Amplifier
Страниц / Страница11 / 9 — STANDARD. 5962-95596. MICROCIRCUIT DRAWING
Формат / Размер файлаPDF / 109 Кб
Язык документаанглийский

STANDARD. 5962-95596. MICROCIRCUIT DRAWING

STANDARD 5962-95596 MICROCIRCUIT DRAWING

11 предложений от 11 поставщиков
Микросхема Операционный усилитель, Video Amp Triple ±18V 36V 20Pin CLLCC Tube
EIS Components
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5962-9559601M2A
Analog Devices
63 ₽
ChipWorker
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5962-9559601M2A
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2 304 ₽
AiPCBA
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5962-9559601M2A
Analog Devices
21 382 ₽
Maybo
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5962-9559601M2A
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Текстовая версия документа

TABLE II. Electrical test requirements. Test requirements Subgroups Subgroups (in accordance with (in accordance with MIL-STD-883, MIL-PRF-38535, table III) method 5005, table I) Device Device Device class M class Q class V Interim electrical --- --- --- parameters (see 4.2) Final electrical 1,2,3 1/ 1,2,3 1/ 1,2,3 1/ parameters (see 4.2) Group A test 1,2,3 1,2,3 1,2,3 requirements (see 4.4) Group C end-point electrical 1 1 1,2,3 parameters (see 4.4) Group D end-point electrical 1 1 1,2,3 parameters (see 4.4) Group E end-point electrical --- --- --- parameters (see 4.4) 1/ PDA applies to subgroup 1. 4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein. 4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883: a. Test condition B. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL- STD-883. b. TA = +125°C, minimum. c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL- STD-883. 4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table II herein.
STANDARD
SIZE
5962-95596 MICROCIRCUIT DRAWING A
DLA LAND AND MARITIME REVISION LEVEL SHEET COLUMBUS, OHIO 43218-3990 C 9 DSCC FORM 2234 APR 97 Document Outline DEPARTMENT OF DEFENSE SPECIFICATION DEPARTMENT OF DEFENSE STANDARDS
ТМ Электроникс. Электронные компоненты и приборы. Скидки, кэшбэк и бесплатная доставка