Datasheet AD704/883B (Analog Devices) - 3

AD704/883B 3.2.1 Functional Block Diagram and Terminal Assignments. LCC (E-20A) Connection Diagram AD704 1 T1 T4 4 N N –I OU NC OU –I 3 2 1 20 19 +IN1 4 18 +IN4 NC 5 17 NC AMP 1 AMP 4 +V 6 S 16 –VS AMP 2 AMP 3 NC 7 15 NC +IN2 8 14 +IN3 9 10 11 12 13 2 3 N2 T T NC N3 –I –I
1
OU OU
-00 06
NC = NO CONNECT
70 0
3.2.4 Microcircuit Technology Group.
This microcircuit is covered by technology group (49).
4.2.1 Life Test/Burn-In Circuit.
Steady state life test is per MIL-STD-883 Method 1005. Burn-in MIL-STD-833 Method 1015 Test Condition (B).
2kΩ 2kΩ +15V 0.1µF 6 3 19 1 2 4 20 4 18 2kΩ 2kΩ LCC PIN DESIGNATORS +10V SHOWN 2kΩ 2kΩ 8 14 10 2 12 3 9 13 16 0.1µF –15V 2kΩ 2kΩ MR-820 MR-820 MR-820 47µF 47µF 47µF
2
+ + +
00
+15V –15V +10V
6- 00 07
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Rev. C | Page 3 of 3 Document Outline 1.1 SCOPE 1.2 PART NUMBER Part Number 1.2.3 CASE OUTLINE (X) Package Description 1.3 ABSOLUTE MAXIMUM RATINGS 1.4 THERMAL CHARACTERISTICS 3.2.1 FUNCTIONAL BLOCK DIAGRAM AND TERMINAL ASSIGNMENTS 3.2.4 MICROCIRCUIT TECHNOLOGY GROUP 4.2.1 LIFE TEST/BURN-IN CIRCUIT