Datasheet AD827 (Analog Devices) - 8

TABLE I. Electrical performance characteristics – Continued. Conditions 1/ Test Symbol -55°C ≤ TA ≤ +125°C Group A Device Limits 2/ Unit unless otherwise specified subgroups type Min Max Rise time 3/ 8/ t 4,5,6 01 10 ns R VS = ±5.0 V, ±15 V, RL = 1.0 kΩ, AV = 1, VOUT = 0 V to +200 mV Fall time 3/ 8/ t 4,5,6 01 10 ns F VS = ±5.0 V, ±15 V, RL = 1.0 kΩ, AV = 1, VOUT = 0 V to -200 mV 1/ Unless otherwise specified, for dc tests, source resistance (RS) < 100 Ω, load resistance (RL) > 100 kΩ, and VOUT = 0 V. 2/ The limiting terms “min” (minimum) and “max” (maximum) shall be considered to apply to magnitudes only. Negative current shall be defined as conventional current flow out of a device terminal. 3/ If not tested, shall be guaranteed to the limits specified in table I herein. 4/ This test is guaranteed by testing CMRR. 5/ Quiescent power consumption is based on quiescent supply current test maximum (no load outputs). 6/ Slew rate test limits are guaranteed after 5 minutes of warm up. 7/ Full power bandwidth = SR / (2πVPK). 8/ Rise and fall times are measured between 10 percent and 90 percent points.
STANDARD
SIZE
5962-92117 MICROCIRCUIT DRAWING A
DLA LAND AND MARITIME REVISION LEVEL SHEET COLUMBUS, OHIO 43218-3990 E 8 DSCC FORM 2234 APR 97 Document Outline DEPARTMENT OF DEFENSE SPECIFICATION DEPARTMENT OF DEFENSE STANDARDS