Клеммные колодки Keen Side

Datasheet AD844 (Analog Devices) - 6

ПроизводительAnalog Devices
Описание60 MHz, 2000 V/μs, Monolithic Op Amp with Quad Low Noise
Страниц / Страница12 / 6 — STANDARD. 5962-89644. MICROCIRCUIT DRAWING
Формат / Размер файлаPDF / 75 Кб
Язык документаанглийский

STANDARD. 5962-89644. MICROCIRCUIT DRAWING

STANDARD 5962-89644 MICROCIRCUIT DRAWING

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AD844SQ/QMLR 5962R8964401VPA S Q
Analog Devices
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TABLE I. Electrical performance characteristics – Continued. Conditions 1/ 2/ Test Symbol -55C  TA  +125C Group A Device Limits 3/ Unit V subgroups type S = 15 V unless otherwise specified Min Max Input bias current versus +TCS 5 V to 18 V 5/ 8/ 9/ 4 01, 02 150 nA/V supply 5,6 200 -TCS 4 250 5,6 300 Input bias current versus +TCCM VCM = 10 V 5/ 6/ 8/ 4 01, 02 150 nA/V common-mode 5,6 200 -TCCM 4 160 5,6 200 Common-mode rejection CMRR VCM = 10 V 5/ 8/ 4,5,6 01, 02 35 V/V ratio 1/ Device type 01 supplied to this drawing has been characterized through all levels P, L, and R of irradiation. Device type 02 supplied to this drawing has been characterized through level “L” of irradiation. However, device type 01, is only tested at the “R” level and device type 02 is only tested at the ”L” level. Pre and Post irradiation values are identical unless otherwise specified in table I. When performing post irradiation electrical measurements for any RHA level, TA = +25C. 2/ Device type 01 may be dose rate sensitive in a space environment and demonstrate enhanced low dose rate effect. Radiation end point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition A for device type 01 and condition D for device type 02. Device type 02 is tested at low dose rate. 3/ The magnitude convention is used to establish the limits for these tests. 4/ Input offset voltage parameters are guaranteed after the equivalent of five minutes at TA = +25C. 5/ This parameter is not tested post irradiation. 6/ Bias current parameters are guaranteed maximum after the equivalent of five minutes at TA = +25C. 7/ This parameter is guaranteed by testing common-mode rejection ratio. 8/ Guaranteed, if not tested, to the limits specified in table I herein. 9/ Test conditions are as follows, when +VS = +15 V, -VS = -5 V to -18 V, and when -VS = -15 V, +VS = +5 V to +18 V.
STANDARD
SIZE
5962-89644 MICROCIRCUIT DRAWING A
DLA LAND AND MARITIME REVISION LEVEL SHEET COLUMBUS, OHIO 43218-3990
E 6
DSCC FORM 2234 APR 97
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