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Datasheet AD845 (Analog Devices) - 7

ПроизводительAnalog Devices
ОписаниеPrecision, 16 MHz CBFET Op Amp
Страниц / Страница9 / 7 — STANDARD. 5962-89645. MICROCIRCUIT DRAWING
Формат / Размер файлаPDF / 92 Кб
Язык документаанглийский

STANDARD. 5962-89645. MICROCIRCUIT DRAWING

STANDARD 5962-89645 MICROCIRCUIT DRAWING

14 предложений от 13 поставщиков
Микросхема Операционный усилитель, OP Amp Single GP ±18V 8Pin CDIP
ChipWorker
Весь мир
AD845SQ/883B
Analog Devices
95 ₽
AllElco Electronics
Весь мир
AD845SQ/883B
Analog Devices
по запросу
ТаймЧипс
Россия
AD845SQ/883B
Analog Devices
по запросу
Maybo
Весь мир
AD845SQ/883B
Analog Devices
по запросу
Новое семейство LED-драйверов XLC компании MEAN WELL с дополнительными возможностями диммирования

Модельный ряд для этого даташита

Текстовая версия документа

4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition B. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA = +125°C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD- 883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition B. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA = +125°C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
STANDARD
SIZE
A 5962-89645 MICROCIRCUIT DRAWING
DLA LAND AND MARITIME REVISION LEVEL SHEET COLUMBUS, OHIO 43218-3990 C
7
DSCC FORM 2234 APR 97
ТМ Электроникс. Электронные компоненты и приборы. Скидки, кэшбэк и бесплатная доставка