Datasheet OP471 (Analog Devices) - 6

TABLE I. Electrical performance characteristics – Continued. Conditions 1/ 2/ Test Symbol -55C  TA +125C Group A Device Limits Unit unless otherwise specified subgroups type Min Max Large-signal voltage gain AVS VO = 10 V, 3/ 4 02, 04 350 V/mV RL = 2 k 5, 6 250 Output voltage swing VOP RL = 2 k 3/ 4, 5, 6 All 12 V Supply current 4/ IS No load 1, 2, 3 All 11 mA M,D,P,L,R 1 01, 02 11 M,D,P,L 1 03, 04 11 Slew rate SR AVCL = +21, RL = 10 k, 7 01, 03 1.4 V/s TA = +25C 3/ 02, 04 6.5 Common-mode rejection CMR VCM = IVR = 11 V 3/ 5/ 1 01, 03 110 dB 2, 3 100 1 02, 04 105 2, 3 100 Power supply rejection ratio PSRR VCC = 4.5 V to 18 V 3/ 1 01, 03 1.8 V/V 2, 3 5.6 1 02, 04 5.6 2, 3 10 1/ Device types 01 and 02 supplied to this drawing has been characterized through all levels M, D, P, L, R of irradiation. Device types 03 and 04 supplied to this drawing has been characterized through all levels M, D, P, L of irradiation. However, device types 01 and 02 is only tested at the “R” level and device types 03 and 04 is only tested at the “L” level. Pre and Post irradiation values are identical unless otherwise specified in Table I. When performing post irradiation electrical measurements for any RHA level, TA = +25C. VCC = 15 V, RS = 50 . 2/ For device types 01 and 02, these parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition A for device types 01 and 02 and condition D for device types 03 and 04. Device types 03 and 04, have been tested at low dose rate. 3/ This parameter is not tested post-irradiation. 4/ IS limit equals the total of all amplifiers. 5/ IVR is defined as the VCM range used for the CMR test.
STANDARD
SIZE
5962-88565 MICROCIRCUIT DRAWING A
DLA LAND AND MARITIME REVISION LEVEL SHEET COLUMBUS, OHIO 43218-3990
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DSCC FORM 2234 APR 97