LT1122 ELECTRICAL CHARACTERISTICS Note 1: Stresses beyond those listed under Absolute Maximum Ratings Note 4: Input voltage range functionality is assured by testing offset may cause permanent damage to the device. Exposure to any Absolute voltage at the input voltage range limits to a maximum of 4mV Maximum Rating condition for extended periods may affect device (A, B grades), to 5.7mV (C, D grades). reliability and lifetime. Note 5: Minimum supply voltage is tested by measuring offset voltage to Note 2: The LT1122 is measured in an automated tester in less than one 7mV maximum at ±5V supplies. second after application of power. Depending on the package used, power Note 6: The LT1122 is not tested and not quality-assurance-sampled dissipation, heat sinking, and air flow conditions, the fully warmed up chip at –40°C and at 85°C. These specifications are guaranteed by design, temperature can be 10°C to 50°C higher than the ambient temperature. correlation and/or inference from –55°C, 0°C, 25°C, 70°C and/or 125°C Note 3: Settling time is 100% tested for A- and C-grades using the settling tests. time test circuit shown. This test is not included in quality assurance sample testing. Settling Time Test Fixture DEVICE UNDER TEST 5pF 2k 10V 15V 1% (REGULATED) 7 15V 1 2k 51Ω 4 8 51Ω 1% 2 7 HA5002 – 6 2 LT1122 4 6 1 16 3 5 + 74LS00 4 5 –15V GROUND ALL OTHER INPUTS 2 15 –15V 5.1k* 5.1k VIN 1% 1% 3 14 (MEASURE INPUT PULSE HERE) 4 13 1 TTL 3 LTC201A IN 2 5 12 6 11 7 10 8 9 15V 7 NO CONNECTION ON PINS 15V –10V 10, 11, 12, 14, AND 15 1 (REGULATED) 7 3 51Ω 8 4 51Ω SUMMING + HA5002 NODE 1k 6 OUTPUT 15V + SETTLING LT1223 2 0.1µF 1µF TANT TIME OUTPUT 2 5 (20 TIMES SUM – 4 –15V NODE OUTPUT) 1.5k –15V TYPICAL SUPPLY 79Ω 1N5712 BYPASSING FOR 1N5712 EACH AMP/BUFFER –15V 1µF TANT 0.1µF *THIS RESISTOR CAN BE ADJUSTED TO + NULL OUT ALL OFFSETS AT THE SETTLING TIME OUTPUT. THE AUTOMATED TESTER USES A SEPARATE AUTOZERO CIRCUIT. LT1122•TA02 1122fb For more information www.linear.com/LT1122 5
