7/ Accuracy is measured using circuit configuration in Figure 3 for EAout and Figure 4 for EAout2 TABLE IB NOTES: 1/ Parameter is part of device initial characterization which is only repeated after design and process changes or with subsequent wafer lots TA = 25ºC. 2/ Parameter is not tested post irradiation 3/ The device is considered a 2-terminal device: Pin 1 through Pin 8 are shorted together and Pin 9 through Pin 16 are shorted together.
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