Datasheet BL-HBGGAJX32K-3-TRB (American Bright) - 5

BRIGHT LED ELECTRONICS CORP.
BL-HBGGAJX32K-3-TRB ●
Reliability Test Classification Test Item Reference Standard Test Conditions Result
Operation Life MIL-STD-750:1026 IF=20mA MIL-STD-883:1005 Ta=Under room temperature 0/20 JIS-C-7021 :B-1 Test time=1,000hrs High Ta=+65℃±5℃ Temperature MIL-STD-202:103B RH=90%-95% 0/20 High Humidity JIS-C-7021 :B-11 Test time=240hrs Endurance Storage Test High High Ta=+85℃±5℃ MIL-STD-883:1008 Temperature Test time=1,000hrs 0/20 JIS-C-7021 :B-10 Storage Low Low Ta=-35℃±5℃ Temperature JIS-C-7021 :B-12 Test time=1,000hrs 0/20 Storage Temperature MIL-STD-202:107D -35℃ ~ +25℃ ~ +85℃ ~ +25℃ Cycling MIL-STD-750:1051 60min 20min 60min 20min 0/20 MIL-STD-883:1010 Test Time=5cycle JIS-C-7021 :A-4 Thermal Shock MIL-STD-202:107D -35℃±5℃ ~+85℃±5℃ Environmental MIL-STD-750:1051 20min 20min 0/20 Test MIL-STD-883:1011 Test Time=10cycle Solder Preheating： MIL-STD-202:201A Resistance 140℃-160℃,within 2 minutes. MIL-STD-750:2031 0/20 Operation heating： JIS-C-7021 :A-1 260℃(Max.), within 10seconds. (Max.) ●
Judgment criteria of failure for the reliability Measuring items Symbol Measuring conditions Judgment criteria for failure
Luminous intensity Iv ( mcd) IF=20mA Below S1X0.5 Note: 1. U means the upper limit of specified characteristics. S means initial value. 2. After each test, remove test pieces, wait for 2 hours and test pieces have returned to ambient temperature, then take next measurement. Ver1.0 Page: 5 of 8