Datasheet ADL5304 (Analog Devices) - 9

Data Sheet ADL5304 103 300 TYPICAL +3σ 102 –3σ 250 101 A) 200 n ( 100 NT UNT 150 99 CO CURRE F 100 IRE 98 50 97 96 0
015
–40 –20 0 20 40 60 80
018
1.00 1.05 1.10 1.15 1.20 TEMPERATURE (°C) I
09459-
MON CURRENT (mA)
09459- Figure 15. IREF Current vs. Temperature Figure 18. IMON Histogram at INUM = 1 mA
5 5 +3σ +3σ 4 –3σ 4 –3σ 3 3 2 2 ) ) V mV 1 ( m 1 T F 0 IFT ( 0 R DRI 5V –1 LT D –1 1P V 2 –2 –2 –3 –3 –4 –4 –5 –5
016
–40 –20 0 20 40 60 80
019
–40 –20 0 20 40 60 80 TEMPERATURE (°C)
09459-
TEMPERATURE (°C)
09459- Figure 16. 1P5V Drift vs. Temperature Figure 19. 2VLT Drift vs. Temperature
1.515 2.000 1.995 1.510 E (V) E (V) G 1.990 G A A T 1.505 T L L 1.985 E VO E VO C C 1.500 EN EN ER ER 1.980 EF EF R R 1.495 1.975 1.490 1.970
017
–5 –4 –3 –2 –1 0 1 2 3 4 5 6 7 8 9 10
020
–20 –15 –10 –5 0 LOAD CURRENT (mA) LOAD CURRENT (mA)
09459- 09459- Figure 17. 1P5V vs. ILOAD (Positive Current Defined into 1P5V Pin) Figure 20. 2VLT vs. ILOAD (Positive Current Defined into 2VLT Pin) Rev. A | Page 9 of 32 Document Outline FEATURES APPLICATIONS GENERAL DESCRIPTION SIMPLIFIED BLOCK DIAGRAM TABLE OF CONTENTS REVISION HISTORY SPECIFICATIONS ABSOLUTE MAXIMUM RATINGS ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS TEST CIRCUITS TERMINOLOGY THEORY OF OPERATION BASIC CONCEPTS OPTICAL MEASUREMENTS Decibel Scaling CIRCUIT DESCRIPTION Bandwidth vs. Current Noise vs. Current Filtering to Improve Noise and Dynamic Behavior Photodiode Bias Reference Outputs Buffer Amplifier Setting the Log Slope and Intercept Slope Inversion Log Ratio Operation APPLICATIONS INFORMATION USING THE ADL5304 Using the Adaptive Bias Summing Node Voltage Leakage VLOG Output Dynamic Response USING A NEGATIVE SUPPLY EVALUATION BOARD SCHEMATIC AND SILKSCREENS OUTLINE DIMENSIONS ORDERING GUIDE