INTEGRATED CIRCUITS DIVISION NCD2400M5. Manufacturing Information5.1 Moisture Sensitivity All plastic encapsulated semiconductor packages are susceptible to moisture ingression. IXYS Integrated Circuits Division classifies its plastic encapsulated devices for moisture sensitivity according to the latest version of the joint industry standard, IPC/JEDEC J-STD-020 , in force at the time of product evaluation. We test all of our products to the maximum conditions set forth in the standard, and guarantee proper operation of our devices when handled according to the limitations and information in that standard as well as to any limitations set forth in the information or standards referenced below. Failure to adhere to the warnings or limitations as established by the listed specifications could result in reduced product performance, reduction of operable life, and/or reduction of overall reliability. This product carries a Moisture Sensitivity Level (MSL) classification as shown below, and should be handled according to the requirements of the latest version of the joint industry standard IPC/JEDEC J-STD-033 . DeviceMoisture Sensitivity Level (MSL) Classification NCD2400M - All Versions MSL 1 5.2 ESD Sensitivity This product is ESD Sensitive , and should be handled according to the industry standard JESD-625 . 5.3 Soldering Profile Provided in the table below is the Classification Temperature (TC) of this product and the maximum dwell time the body temperature of this device may be (TC - 5)ºC or greater. The classification temperature sets the Maximum Body Temperature allowed for this device during lead-free reflow processes. For through-hole devices, and any other processes, the guidelines of J-STD-020 must be observed. DeviceClassification Temperature (TC)Dwell Time (tp)Max Reflow Cycles NCD2400M - All Versions 260°C 30 seconds 3 5.4 Board Wash IXYS Integrated Circuits Division recommends the use of no-clean flux formulations. Board washing to reduce or remove flux residue following the solder reflow process is acceptable provided proper precautions are taken to prevent damage to the device. These precautions include but are not limited to: using a low pressure wash and providing a follow up bake cycle sufficient to remove any moisture trapped within the device due to the washing process. Due to the variability of the wash parameters used to clean the board, determination of the bake temperature and duration necessary to remove the moisture trapped within the package is the responsibility of the user (assembler). Cleaning or drying methods that employ ultrasonic energy may damage the device and should not be used. Additionally, the device must not be exposed to flux or solvents that are Chlorine- or Fluorine-based. R01 www.ixysic.com 21 Document Outline Features Applications Description 1. Specifications 1.1 Package Pinout 1.2 Pin Descriptions 1.3 Absolute Maximum Ratings 1.4 Recommended Operating Conditions 1.5 ESD Rating 1.6 General Conditions for Electrical Characteristics 1.7 Capacitor Electrical Characteristics 1.8 Digital Interface: Electrical Characteristics of SDA and SCL 1.9 Digital Interface: AC Characteristics 1.10 Power Supply 2. Performance Data 3. Functional Description 3.1 Introduction 3.2 Capacitive Digital to Analog Converter (CDAC) 3.3 Non-Volatile Memory Configuration 3.4 Device Address 3.5 Operating Modes 3.5.1 Volatile Mode 3.5.2 Non-Volatile Mode 3.6 I2C Serial Interface 3.6.1 Write Commands 3.6.2 Write Volatile Register Operation 3.6.3 Write Non-Volatile Memory Operation 3.6.4 Read Operation 3.6.5 Set Non-Volatile Mode Operation 3.6.6 Electrical and Timing Considerations 3.6.7 Application Diagrams 3.7 Capacitor Interface Electrical and Biasing Considerations 4. Capacitance Determination and Programming Procedure 5. Manufacturing Information 5.1 Moisture Sensitivity 5.2 ESD Sensitivity 5.3 Soldering Profile 5.4 Board Wash 5.5 Mechanical Dimensions 5.5.1 Package Dimensions 5.5.2 Tape & Reel Specification
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