Datasheet ADIS16365 (Analog Devices) - 7

Data Sheet ADIS16365 ABSOLUTE MAXIMUM RATINGS Table 3.
Stresses at or above those listed under Absolute Maximum
Parameter Rating
Ratings may cause permanent damage to the product. This is a Acceleration stress rating only; functional operation of the product at these Any Axis, Unpowered 2000 g or any other conditions above those indicated in the operational Any Axis, Powered 2000 g section of this specification is not implied. Operation beyond VCC to GND −0.3 V to +6.0 V the maximum operating conditions for extended periods may Digital Input Voltage to GND −0.3 V to +5.3 V affect product reliability. Digital Output Voltage to GND −0.3 V to VCC + 0.3 V Analog Input to GND −0.3 V to +3.6 V Operating Temperature Range −40°C to +105°C
Table 4. Package Characteristics
Storage Temperature Range −65°C to +125°C1, 2
Package Type θJA θJC Device Weight
1 24-Lead Module 39.8°C/W 14.2°C/W 16 grams Extended exposure to temperatures outside the specified temperature range of −40°C to +105°C can adversely affect the accuracy of the factory (ML-24-2) calibration. For best accuracy, store the parts within the specified operating range of −40°C to +105°C. 2 Although the device is capable of withstanding short-term exposure to 150°C, long-term exposure threatens internal mechanical integrity.
ESD CAUTION
Rev. F | Page 7 of 21 Document Outline FEATURES APPLICATIONS FUNCTIONAL BLOCK DIAGRAM GENERAL DESCRIPTION TABLE OF CONTENTS REVISION HISTORY SPECIFICATIONS TIMING SPECIFICATIONS TIMING DIAGRAMS ABSOLUTE MAXIMUM RATINGS ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS THEORY OF OPERATION BASIC OPERATION READING SENSOR DATA DEVICE CONFIGURATION MEMORY MAP BURST READ DATA COLLECTION OUTPUT DATA REGISTERS CALIBRATION Manual Bias Calibration Gyroscope Automatic Bias Null Calibration Gyroscope Precision Automatic Bias Null Calibration Restoring Factory Calibration Linear Acceleration Bias Compensation (Gyroscope) OPERATIONAL CONTROL Global Commands Internal Sample Rate Power Management Sensor Bandwidth Digital Filtering Dynamic Range INPUT/OUTPUT FUNCTIONS General-Purpose I/O Input Clock Configuration Data Ready I/O Indicator Auxiliary DAC DIAGNOSTICS Self-Test Memory Test Status Alarm Registers PRODUCT IDENTIFICATION APPLICATIONS INFORMATION INSTALLATION AND HANDLING GYROSCOPE BIAS OPTIMIZATION INPUT ADC CHANNEL PC-BASED EVALUATION TOOLS X-RAY SENSITIVITY OUTLINE DIMENSIONS ORDERING GUIDE