Datasheet TLP2363 (Toshiba) - 6

TLP2363 11. Test Circuits and Characteristics Curves 11.1. Test Circuits Fig. 11.1.1 IOH Test Circuit Fig. 11.1.2 VOL Test Circuit Fig. 11.1.3 ICCL Test Circuit Fig. 11.1.4 ICCH Test Circuit Fig. 11.1.5 Switching Time Test Circuit and Waveform Fig. 11.1.6 Common-Mode Transient Immunity Test Circuit and Waveform ©2019 6 2019-11-07 Toshiba Electronic Devices & Storage Corporation Rev.1.0