Datasheet AMP01 (Analog Devices) - 6

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AMP01 Data Sheet AMP01E AMP01F/AMP01G Parameter Sy Test Conditions/Commen mbol ts Min Typ Max Min Typ Max Unit
INPUT Input Resistance RIN Differential, G = 1000 1 1 GΩ Differential, G ≤ 100 10 10 GΩ Common mode, G = 1000 20 20 GΩ Input Voltage Range IVR TA = 25°C3 ±10.5 ±10.5 V TMIN ≤ TA ≤ TMAX ±10.0 ±10.0 V Common-Mode Rejection CMR VCM = ±10 V, 1 kΩ source imbalance G = 1000 125 130 115 125 dB G = 100 120 130 110 125 dB G = 10 100 120 95 110 dB G = 1 85 100 75 90 dB TMIN ≤ TA ≤ TMAX G = 1000 120 125 110 120 dB G = 100 115 125 105 120 dB G = 10 95 115 90 105 dB G = 1 80 95 75 90 dB 1 Sample tested. 2 VIOS and VOOS nulling has minimal effect on TCVIOS and TCVOOS, respectively. 3 Refer to the Common-Mode Rejection section. Rev. F | Page 6 of 29 Document Outline FEATURES GENERAL DESCRIPTION FUNCTIONAL BLOCK DIAGRAM TABLE OF CONTENTS REVISION HISTORY SPECIFICATIONS ELECTRICAL CHARACTERISTICS DICE CHARACTERISTICS WAFER TEST LIMITS (AMP01NBC) ABSOLUTE MAXIMUM RATINGS THERMAL RESISTANCE ESD CAUTION PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS THEORY OF OPERATION INPUT AND OUTPUT OFFSET VOLTAGES INPUT BIAS AND OFFSET CURRENTS GAIN COMMON-MODE REJECTION ACTIVE GUARD DRIVE GROUNDING SENSE AND REFERENCE TERMINALS DRIVING 50 Ω LOADS HEATSINKING OVERVOLTAGE PROTECTION POWER SUPPLY CONSIDERATIONS APPLICATIONS CIRCUITS OUTLINE DIMENSIONS ORDERING GUIDE