Поставки продукции Megawin по официальным каналам - микроконтроллеры, мосты USB-UART

Datasheet AP63356Q, AP63357Q (Diodes) - 4

ПроизводительDiodes
ОписаниеAutomotive-Compliant, 32V, 3.5A Low IQ Synchronous Buck Converter
Страниц / Страница28 / 4 — AP63356Q/AP63357Q. Absolute Maximum Ratings. Symbol. Parameter. Rating. …
Формат / Размер файлаPDF / 1.7 Мб
Язык документаанглийский

AP63356Q/AP63357Q. Absolute Maximum Ratings. Symbol. Parameter. Rating. Unit. ESD Susceptibility (Note 5). Thermal Resistance

AP63356Q/AP63357Q Absolute Maximum Ratings Symbol Parameter Rating Unit ESD Susceptibility (Note 5) Thermal Resistance

32 предложений от 10 поставщиков
DCDC CONV HV BUCK V-DFN3020-13 T / Buck Switching Regulator IC Positive Adjustable 0.8V 1 Output 3.5A 13-PowerVFDFN
Зенер
Россия и страны ТС
AP63357QZV-7
от 41 ₽
ЧипСити
Россия
AP63357QZV-7
Diodes
55 ₽
AP63357QZV-7
Diodes
от 99 ₽
Эиком
Россия
AP63357QZV-7
Diodes
от 119 ₽
SiC-компоненты от ведущих китайских производителей

Модельный ряд для этого даташита

Текстовая версия документа

AP63356Q/AP63357Q Absolute Maximum Ratings
(Note 4) (@ TA = +25°C, unless otherwise specified.)
Symbol Parameter Rating Unit
-0.3 to +35.0 (DC) VIN Supply Pin Voltage V -0.3 to +40.0 (400ms) VEN Enable/UVLO Pin Voltage -0.3 to +35.0 V VFB Feedback Pin Voltage -0.3 to +6.0 V VCOMP Compensation Pin Voltage -0.3 to +6.0 V VPG Power-Good Pin Voltage -0.3 to +6.0 V VBST Bootstrap Pin Voltage VSW - 0.3 to VSW + 6.0 V -0.3 to VIN + 0.3 (DC) VSW Switch Pin Voltage V -2.5 to VIN + 2.0 (20ns) TSTG Storage Temperature -65 to +150 °C TJ Junction Temperature +170 °C TL Lead Temperature +260 °C
ESD Susceptibility (Note 5)
HBM Human Body Model ±2000 V CDM Charged Device Model ±1000 V Notes: 4. Stresses greater than the Absolute Maximum Ratings specified above can cause permanent damage to the device. These are stress ratings only; functional operation of the device at these or any other conditions exceeding those indicated in this specification is not implied. Device reliability can be affected by exposure to absolute maximum rating conditions for extended periods of time. 5. Semiconductor devices are ESD sensitive and can be damaged by exposure to ESD events. Suitable ESD precautions should be taken when handling and transporting these devices.
Thermal Resistance
(Note 6)
Symbol Parameter Rating Unit
V-DFN3020-13/SWP θJA Junction to Ambient 25 °C/W (Type A1) V-DFN3020-13/SWP θJC Junction to Case 5 °C/W (Type A1) Note: 6. Test condition for V-DFN3020-13/SWP (Type A1): Device mounted on FR-4 substrate, four-layer PC board, 2oz copper, with minimum recommended pad layout.
Recommended Operating Conditions
(Note 7) (@ TA = +25°C, unless otherwise specified.)
Symbol Parameter Min Max Unit
VIN Supply Voltage 3.8 32 V VOUT Output Voltage 0.8 VIN V TA Operating Ambient Temperature -40 +125 °C TJ Operating Junction Temperature -40 +150 °C Note: 7. The device function is not guaranteed outside of the recommended operating conditions. AP63356Q/AP63357Q 4 of 28 September 2020 Document number: DS41948 Rev. 1 - 2
www.diodes.com
© Diodes Incorporated
ТМ Электроникс. Электронные компоненты и приборы. Скидки, кэшбэк и бесплатная доставка