ZR431ADJUSTABLE PRECISION ZENER SHUNT REGULATORDC Test Circuits I I V L L Input Z Input V V Z Input Z
IZOFF N I I Z Z I R1 I O REF REF ATI VREF R2 RM VREF O F N Fig. 1 Test Circuit for V Fig.3 Test Circuit for Off State Current Z = VREF Fig. 2 Test Circuit for VZ > VREF CE I Deviation of reference input voltage, VDEV, is defined as the maximum variation of the reference input voltage over the full ADVAN temperature range. The average temperature coefficient of the reference input voltage, VREF is defined as: VMAX V ×1000000 V ppm ( /o C) dev = ref V ( 1 T − T2) ref The dynamic output impedance, RZ is defined as: V Δ z R = z V = V - V I Δ DEV MAX MIN z VMIN When the device is programmed with two external resistors, R1 and R2, (Fig 2), the dynamic output impedance of the overall circuit, R’, is defined as: 1 R R′ = R 1 ( + ) z R2 T1 Temperature T2
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