link to page 6 ADG1308/ADG1309ABSOLUTE MAXIMUM RATINGS TA = 25°C, unless otherwise noted. Table 3. Stresses above those listed under Absolute Maximum Ratings Parameter Rating may cause permanent damage to the device. This is a stress VDD to VSS 35 V rating only; functional operation of the device at these or any VDD to GND −0.3 V to +25 V other conditions above those indicated in the operational VSS to GND +0.3 V to −25 V section of this specification is not implied. Exposure to absolute Analog, Digital Inputs1 VSS − 0.3 V to VDD + 0.3 V or maximum rating conditions for extended periods may affect 30 mA (whichever occurs first) device reliability. Continuous Current, S or D pins 30 mA Peak Current, S or D pins 100 mA (Pulsed at 1 ms, 10% Duty Cycle Maximum) Operating Temperature Range Industrial (B Version) –40°C to +105°C Storage Temperature Range –65°C to +150°C Junction Temperature 150°C TSSOP, θJA, 112°C/W Thermal Impedance 16-Lead SOIC, θJA, 77°C/W Thermal Impedance Reflow Soldering Peak 260 (+0/−5)°C Temperature (Pb-free) 1 Overvoltages at A, EN, S, or D pins are clamped by internal diodes. Current should be limited to the maximum ratings provided. ESD CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although this product features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality. Rev. A | Page 6 of 16 Document Outline FEATURES APPLICATIONS FUNCTIONAL BLOCK DIAGRAMS GENERAL DESCRIPTION PRODUCT HIGHLIGHTS TABLE OF CONTENTS REVISION HISTORY SPECIFICATIONS DUAL SUPPLY SINGLE SUPPLY ABSOLUTE MAXIMUM RATINGS ESD CAUTION PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS ADG1308 TRUTH TABLE ADG1309 TRUTH TABLE TYPICAL PERFORMANCE CHARACTERISTICS TEST CIRCUITS TERMINOLOGY OUTLINE DIMENSIONS ORDERING GUIDE
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