Datasheet ADG428, ADG429 (Analog Devices) - 9

ADG428/ADG429 TEST CIRCUITS IDS VDD VSS V1 VDD VSS S1 S2 D S D S8 +0.8V EN A ID (OFF) GND V VS S VD RON = V1/IDS
Test Circuit 1. On Resistance Test Circuit 3. I (OFF) D
VDD VSS VDD VSS VDD VSS VDD VSS S1 S1 D S2 D I A S (OFF) S8 S8 A I +0.8V 2.4V D (ON) EN EN GND V GND S VD V V S D
Test Circuit 2. I Test Circuit 4. I S (OFF) D (ON)
VDD VSS 3V VDD VSS ENABLE 50% 50% DRIVE – V A0 IN S1 VS1 0V V A1 IN 50
V
S2–S7 A2 ADG428* tTRANSITION tTRANSITION S8 VS8 2.4V EN 90% OUTPUT RS D OUTPUT GND WR 1M
V
35pF 90% *SIMILAR CONNECTION FOR ADG429
Test Circuit 5. Switching Time of Multiplexer, tTRANSITION
VDD VSS V 3V DD VSS A0 ADDRESS S1 V DRIVE – V S IN V A1 IN 50
V
S2–S7 0V A2 ADG428* S8 2.4V EN OUTPUT 80% 80% RS D OUTPUT GND WR 1k
V
35pF tOPEN *SIMILAR CONNECTION FOR ADG429
Test Circuit 6. Break-Before-Make Delay, tOPEN REV. C –9–