AD9731EXPLANATION OF TEST LEVELSABSOLUTE MAXIMUM RATINGS* Analog Output . –VS to +VS Test LevelDefinition +VS . +6 V I 100% production tested Digital Inputs . –0.7 V to +VS –V II The parameter is 100% production tested at S . –7 V Analog Output Current . 30 mA 25∞C; sampled at temperature production. Control Amplifier Input Voltage Range . 0 V to –4 V III Sample tested only Reference Input Voltage Range . 0 V to –VS IV Parameter is guaranteed by design and Maximum Junction Temperature . 150∞C characterization testing. Operating Temperature Range . –40∞C to +85∞C V Parameter is a typical value only. Internal Reference Output Current . 500 mA VI All devices are 100% production tested at 25 Lead Temperature (10 sec Soldering) . 300∞C ∞C; guaranteed by design and characterization testing Storage Temperature . –65∞C to +165∞C for industrial temperature range devices. Control Amplifier Output Current . ± 2.5 mA *Stresses above those listed under Absolute Maximum Ratings may cause perma- nent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating OBSOLETE conditions for extended periods may affect device reliability. ORDERING GUIDETemperaturePackagePackageModelRangeDescriptionOptions AD9731BR –40∞C to +85∞C 28-Lead Wide Body (SOIC) R-28 AD9731BR-REEL –40∞C to +85∞C 28-Lead Wide Body (SOIC) R-28 AD9731BRS –40∞C to +85∞C 28-Lead Shrink Small (SSOP) RS-28 AD9731BRS-REEL –40∞C to +85∞C 28-Lead Shrink Small (SSOP) RS-28 AD9731-PCB 0∞C to 70∞C PCB CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD9731 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality. –4– REV. B Document Outline FEATURES APPLICATIONS FUNCTIONAL BLOCK DIAGRAM GENERAL DESCRIPTION SPECIFICATIONS ABSOLUTE MAXIMUM RATINGS EXPLANATION OF TEST LEVELS ORDERING GUIDE PIN FUNCTION DESCRIPTIONS PIN CONFIGURATION Typical Performance Characteristics THEORY AND APPLICATIONS Digital Inputs/Timing Input Clock and Data Timing Relationship References Analog Output EVALUATION BOARD OUTLINE DIMENSIONS Revision History
