Datasheet BRT21, BRT22, BRT23 (Vishay) - 3

BRT21, BRT22, BRT23
www.vishay.com Vishay Semiconductors
ELECTRICAL CHARACTERISTICS
(Tamb = 25 °C, unless otherwise specified)
PARAMETER TEST CONDITION PART SYMBOL MIN. TYP. MAX. UNIT INPUT
Forward voltage IF = 10 mA VF - 1.16 1.35 V Reverse current VR = 6 V IR - 0.1 10 μA Capacitance f = 1 MHz, VF = 0 V CO - 25 - pF Thermal resistance, junction to ambient RthJA - 750 - K/W
OUTPUT
BRT21 - 400 - Peak off-state voltage ID(RMS) = 100 μA BRT22 VDM - 600 - V BRT23 - 800 - Off-state current VD = VDRM, Tamb = 100 °C, IF = 0 mA ID(RMS) - 10 100 μA On-state voltage IT = 300 mA VTM - 1.7 3 V On-state current PF = 1, VT(RMS) = 1.7 V ITM - - 300 mA Surge (non-repetitive), on-state current f = 50 Hz ITSM - - 3 A ΔIFT1/ΔTj - 7 14 μA/K Trigger current temp. gradient ΔIFT2/ΔTj - 7 14 μA/K Inhibit voltage temp. gradient ΔVDINH/ΔTj - -20 - mV/K Off-state current in inhibit state IF = IFT1, VDRM IDINH - 50 200 μA Holding current IH - 65 500 μA Latching current VT = 2.2 V IL - 5 - mA Zero cross inhibit voltage IF = rated IFT VIH - 15 25 V
OUTPUT
(continued) Turn-on time VRM = VDM = VD(RMS) ton - 35 - μs Turn-off time PF = 1, IT = 300 mA toff - 50 - μs VD = 0.67 VDRM, Tj = 25 °C dV/dtcr 10 000 - - V/μs Critical rate of rise of off-state voltage VD = 0.67 VDRM, Tj = 80 °C dV/dtcr 5000 - - V/μs VD = 230 VRMS, dV/dtcrq - 8 - V/μs Critical rate of rise of voltage at ID = 300 mARMS, Tj = 25 °C current commutation VD = 230 VRMS, dV/dt I crq - 7 - V/μs D = 300 mARMS, Tj = 85 °C Critical rate of rise of on-state at VD = 230 VRMS, dI/dt current commutation I crq - 12 - A/ms D = 300 mARMS, Tj = 25 °C Thermal resistance, junction-to-ambient RthJA - 125 - K/W
COUPLER
Critical rate of rise of coupled I input / output voltage T = 0 A, VRM = VDM = VD(RMS) dVIO/dt - 10 000 - V/μs Common mode coupling capacitance CCM - 0.01 - pF Capacitance (input to output) f = 1 MHz, VIO = 0 V CIO - 0.8 - pF VD = 5 V, F - versions IFT - - 1.2 mA Trigger current VD = 5 V, H - versions IFT - - 2 mA
Note
• Minimum and maximum values are testing requirements. Typical values are characteristics of the device and are the result of engineering evaluation. Typical values are for information only and are not part of the testing requirements. Rev. 2.1, 21-Jun-2023
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