Datasheet TS432AIX, TS432BIX (Taiwan Semiconductor) - 6

TS432xIX
Taiwan Semiconductor
TYPICAL PERFORMANCE CHARACTERISTICS Test Circuit for Curve A
The areas under the curves represent conditions that may cause the device to oscillate. For curves B, C, and D, R2 and V+ were adjusted to establish the initial VKA and IKA conditions with CL=0. VBATT and CL then were adjusted to
Test Circuit for Curve B, C and D
determine the ranges of stability.
Figure 17: Stability Boundary Condition Test Circuit for Pulse Response, Ik=1mA Figure 18: Pulse Response
6 Version: E1811