Статьи - Измерения - 3

Keith Szolusha Kyle Lawrence

Machine vision systems use very short flashes of intense light to produce high speed images used in a wide variety of data processing applications. For instance, fast moving conveyor belts are run through machine vision systems for quick label and ...

For most applications, current measurements are made by sensing the voltage drop across a resistor. There are two locations in a circuit that resistors are commonly placed for current measurements. The first location is between the power supply and ...

Andreas Grün

Using a PN-junction diode for temperature measurement usually depends on its 2 mV/K temperature coefficient. Conventionally, you must amplify and digitize this voltage with an ADC before you can use the value in a microcontroller. Less well-known ...

Robert Zawislak

In multiple-output power supplies in which a single supply powers circuitry of vastly different current draws, two perplexing steps are sensing the current that each output draws and deactivating the power supply in the event of an overload on that ...

The more linear the sensor’s output, the easier it is to calibrate and to minimize uncertainty in output scaling Most analog output sensors have general specifications such as linearity (or non-linearity), repeatability, and resolution, as ...

What is Air Pollution? Air pollution is the presence of excessive amount of unwanted harmful solid and gases substances in the air. Cause and Effect of Air Pollution Recently, many cities in the world have encountered rapid urbanization and this ...

Part 1 The safety shield surrounds the electrostatic shield, protecting the instrument user from hazardous voltages on the DUT, or the measurement leads. The safety shield should be connected to earth ground at the instrument, and it should have a ...

Inadequate shielding and bad grounding are often blamed when measurements are inaccurate, especially in high-impedance applications. In fact, shielding and grounding problems are frequently responsible for measurement errors, but many test system ...